一种基于单片机智能电容测试仪的设计与实现

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一种基于单片机智能电容测试仪的设计与实现

作者：徐思成

来源：《现代电子技术》2010年第18期

摘要:在分析和比较传统电容测量仪表的基础上,提出一种新型智能电容测试仪的设计及实现方案。仪表以MCS-51单片机为控制核心,结合多谐振荡器和多路开关,仅用较少的外围资源即可实现,且结构简单,成本低廉,可获测量过程智能化和实现数字显示。经系统测试和使用,该方法性能可靠,测量精度高,弥补了传统测量方法的不足,达到了预期的设计效果。关键词:单片机;智能电容测试; 多谐振荡器;数字显示

中图分类号:TN710-34文献标识码:A

文章编号:1004-373X(2010)18-0028-02

Design and Realization of Intelligent Capacitance TesterBased on Single Chip Microcomuter

XU Si-cheng

(Department of Mechanical and Electrical Engineering, Henan Quantity Engineering Vocation College, Pingdingshan 467002, China)

Abstract: A new scheme for design and implementation of the intelligent capacitance tester is proposed based on the analysis and comparison of traditional capacitance measuring instrument. Taking MCS-51 SCM as a control core of the instrument, the instrument was realized in combination with multichannel harmonic oscillator, multi-way switch and fewer external resources, and the measurement process intellectualization, simple structure, low cost and digital display were achieved. The system testing and application prove that the system has reliable performance, high accuracy of measurement, and achieves the desired effect of the design.Keywords: single chip micro-controller; intelligent capacitance tester; multivibrator; digital display

0 引言

测量电容元件集中参数值的仪表种类较多,方法也各有不同,但都有其优缺点。一般的测量方法都存在计算复杂,不易实现自动测量,而且很难实现智能化的不足。该设计打破了传统的设计模式,首先把较难测量的电容元件参数利用555定时器构成的多谐振荡器转换成简易测量的