High Speed IGBT in NPT-technology
? 30% lower E off compared to previous generation
? Short circuit withstand time – 10 μs
? Designed for operation above 30 kHz
? NPT-Technology for 600V applications offers:
- parallel switching capability
- moderate E off increase with temperature - very tight parameter distribution
? High ruggedness, temperature stable behaviour
? Qualified according to JEDEC 1 for target applications
? Complete product spectrum and PSpice Models : https://www.sodocs.net/doc/9e4774381.html,/igbt/
Type
V CE
I C
E off
T j
Marking Package Ordering Code
SGB15N60HS 600V 15A 200μJ 150°C G15N60HS P-TO-263-3-2 Q67040-S4535
Maximum Ratings
Parameter Symbol Value Unit Collector-emitter voltage V C E 600 V DC collector current T C = 25°C T C = 100°C
I C
27 15
Pulsed collector current, t p limited by T jmax I C p u l s 60
Turn off safe operating area V CE ≤ 600V, T j ≤ 150°C
-
60
A
Gate-emitter voltage static
transient (t p <1μs, D <0.05) V G E
±20
±30
V
Short circuit withstand time 2) V GE = 15V, V CC ≤ 400V, T j ≤ 150°C t S C 10 μs
Power dissipation T C = 25°C
P t o t 138 W Operating junction and storage temperature
T j ,T s t g -55...+150 Time limited operating junction temperature for t < 150h T j (t l ) 175 Soldering temperature (reflow soldering, MSL1)
-
220
°C
1
J-STD-020 and JESD-022
2)
Allowed number of short circuits: <1000; time between short circuits: >1s.
P-TO-263-3-2 (D2-PAK)
(TO-263AB)
Thermal Resistance
Parameter Symbol Conditions Max. Value Unit Characteristic
IGBT thermal resistance, junction – case R t h J C
0.9
Thermal resistance, junction – ambient
R t h J A 62
K/W
SMD version, device on PCB 1) R t h J A
40
Electrical Characteristic, at T j = 25 °C, unless otherwise specified
Value Parameter Symbol Conditions min. Typ. max. Unit
Static Characteristic
Collector-emitter breakdown voltage V (B R )C E S V G E =0V, I C =500μA 600 - - Collector-emitter saturation voltage
V C E (s a t )
V G E = 15V, I C =15A T j =25°C T j =150°C
2.8
3.5 3.15
4.00 Gate-emitter threshold voltage V G E (t h ) I C =400μA,V C E =V G E 3 4 5
V Zero gate voltage collector current
I C E S
V C E =600V,V G E =0V T j =25°C T j =150°C
- -
- -
40 2000
μA
Gate-emitter leakage current I G E S V C E =0V,V G E =20V - - 100 nA Transconductance g f s V C E =20V, I C =15A
- 10
S
Dynamic Characteristic Input capacitance C i s s - 810 Output capacitance
C o s s - 83
Reverse transfer capacitance C r s s V C E =25V, V G E =0V, f =1MHz - 51 pF
Gate charge
Q G a t e
V C C =480V, I C =15A V G E =15V
- 80 nC
Internal emitter inductance
measured 5mm (0.197 in.) from case L E
- 7 nH Short circuit collector current 2)
I C (S C )
V G E =15V,t S C ≤10μs V C C ≤ 400V, T j ≤ 150°C
- 135 A
1)
Device on 50mm*50mm*1.5mm epoxy PCB FR4 with 6cm 2 (one layer, 70μm thick) copper area for
collector connection. PCB is vertical without blown air. 2)
Allowed number of short circuits: <1000; time between short circuits: >1s.
Switching Characteristic, Inductive Load, at T j =25 °C
Value
Parameter Symbol Conditions min. typ. max. Unit
IGBT Characteristic Turn-on delay time t d (o n ) - 13 Rise time
t r - 14 Turn-off delay time t d (o f f ) - 209 Fall time t f - 15 ns Turn-on energy E o n - 0.32 Turn-off energy E o f f - 0.21 Total switching energy E t s T j =25°C,
V C C =400V,I C =15A,V G E =0/15V,
R G =23?
L σ1)
=60nH, C σ1)
=40pF Energy losses include
“tail” and diode
reverse recovery. - 0.53
mJ
Switching Characteristic, Inductive Load, at T j =150 °C
Value
Parameter Symbol Conditions min. typ. max. Unit
IGBT Characteristic Turn-on delay time t d (o n ) - 11 Rise time
t r - 6 Turn-off delay time t d (o f f ) - 72 Fall time t f - 26 ns Turn-on energy E o n - 0.38 Turn-off energy E o f f - 0.20 Total switching energy E t s
T j =150°C
V C C =400V,I C =15A,V G E =0/15V,
R G = 3.6?
L σ1) =60nH, C σ1)
=40pF Energy losses include
“tail” and diode
reverse recovery. - 0.58 mJ Turn-on delay time t d (o n ) - 12 Rise time
t r - 15 Turn-off delay time t d (o f f ) - 235 Fall time t f - 17 ns Turn-on energy E o n - 0.48 Turn-off energy E o f f - 0.30 Total switching energy E t s
T j =150°C
V C C =400V,I C =15A,V G E =0/15V,
R G = 23?
L σ1)
=60nH, C σ1)
=40pF Energy losses include
“tail” and diode
reverse recovery. - 0.78 mJ
1)
Leakage inductance L σ and Stray capacity C σ due to test circuit in Figure E.
I C , C O L L E C T O R C U R R E N T
10Hz
100Hz 1kHz 10kHz 100kHz 0A 10A 20A 30A 40A 50A 60A
I C , C O L L E C T O R C U R R E N T
1V
10V 100V 1000V
0,1A
1A
10A
f , SWITCHING FREQUENCY
V CE , COLLECTOR -EMITTER VOLTAGE
Figure 1. Collector current as a function of
switching frequency
(T j ≤ 150°C, D = 0.5, V CE = 400V, V GE = 0/+15V, R G = 23?) Figure 2. Safe operating area
(D = 0, T C = 25°C, T j ≤150°C;V GE =15V)
P t o t , P O W E R D I S S I P A T I O N
25°C
50°C
75°C
100°C
125°C
0W
20W 40W 60W 80W 100W 120W
140W I C , C O L L E C T O R C U R R E N T
25°C
75°C 125°C
0A
10A
20A
T C , CASE TEMPERATURE
T C , CASE TEMPERATURE
Figure 3. Power dissipation as a function of
case temperature (T j ≤ 150°C)
Figure 4. Collector current as a function of
case temperature
(V GE ≤ 15V, T j ≤ 150°C)
I C , C O L L E C T O R C U R R E N T
0V
2V
4V
6V
0A
10A
20A
30A
40A
I C , C O L L E C T O R C U R R E N T
0V
2V
4V
6V
0A 10A
20A
30A
40A
V CE , COLLECTOR -EMITTER VOLTAGE
V CE , COLLECTOR -EMITTER VOLTAGE
Figure 5. Typical output characteristic
(T j = 25°C)
Figure 6. Typical output characteristic
(T j = 150°C)
I C , C O L L E C T O R C U R R E N T
0V
2V
4V
6V
8V
0A
20A
40A
V C E (s a t ), C O L L E C T O R -E M I T T S A T U R A T I O N V O L T A G E
-50°C
0°C
50°C
100°C
150°C 1,0V
1,5V 2,0V 2,5V 3,0V 3,5V 4,0V 4,5V 5,0V 5,5V
V GE , GATE-EMITTER VOLTAGE
T J , JUNCTION TEMPERATURE
Figure 7. Typical transfer characteristic
(V CE =10V)
Figure 8.Typical collector-emitter
saturation voltage as a function of junction temperature (V GE = 15V)
t , S W I T C H I N G T I M E S
0A
10A
20A
1ns
10ns
100ns
t , S W I T C H I N G T I M E S
0?10?20?30?40?
1 ns
10 ns
100 ns
I C , COLLECTOR CURRENT
R G , GATE RESISTOR
Figure 9. Typical switching times as a
function of collector current (inductive load, T J =150°C,
V CE =400V, V GE =0/15V, R G =23?, Dynamic test circuit in Figure E) Figure 10.Typical switching times as a
function of gate resistor (inductive load, T J =150°C,
V CE =400V, V GE =0/15V, I C =15A, Dynamic test circuit in Figure E)
t , S W I T C H I N G T I M E S
0°C
50°C
100°C
150°C
10ns
100ns
V G E (t h ), G A T E -E M I T T T R S H O L D V O L T A G E
-50°C
0°C 50°C 100°C 150°C
1,5V
2,0V 2,5V 3,0V 3,5V 4,0V 4,5V
5,0V
T J , JUNCTION TEMPERATURE
T J , JUNCTION TEMPERATURE
Figure 11. Typical switching times as a
function of junction temperature (inductive load, V CE =400V, V GE =0/15V, I C =15A, R G =23?, Dynamic test circuit in Figure E)
Figure 12. Gate-emitter threshold voltage as
a function of junction temperature (I C = 0.5mA)
E , S W I T C H I N G E N E R G Y L O S S E S
0A 10A 20A 30A
0,0mJ
1,0mJ
2,0mJ
E , S W I T C H I N G E N E R G Y L O S S E S
0?10?20?30?40?
0,0 mJ
0,5 mJ
1,0 mJ
I C , COLLECTOR CURRENT
R G , GATE RESISTOR
Figure 13. Typical switching energy losses
as a function of collector current (inductive load, T J =150°C,
V CE =400V, V GE =0/15V, R G =23?, Dynamic test circuit in Figure E) Figure 14. Typical switching energy losses
as a function of gate resistor (inductive load, T J =150°C,
V CE =400V, V GE =0/15V, I C =15A, Dynamic test circuit in Figure E)
E , S W I T C H I N G E N E R G Y L O S S E S
0°C
50°C 100°C 150°C
0.00mJ
0.25mJ
0.50mJ
0.75mJ
Z t h J C , T R A N S I E N T T H E R M A L R E S I S T A N C E
1μs
10μs 100μs 1ms 10ms 100ms 1s
10-4
K/W
10-3
K/W
10-2
K/W
10-1
K/W
100
K/W
T J , JUNCTION TEMPERATURE
t P , PULSE WIDTH
Figure 15. Typical switching energy losses
as a function of junction temperature
(inductive load, V CE =400V, V GE =0/15V, I C =20A, R G =23?, Dynamic test circuit in Figure E)
Figure 16. IGBT transient thermal resistance
(D = t p / T )
V G E , G A T E -E M I T T E R V O L T A G E
0nC
20nC
40nC
60nC
80nC
0V
5V
10V
15V
c , C A P A C I T A N C E
0V 10V 20V
10pF
100pF
1nF
Q GE , GATE CHARGE
V CE , COLLECTOR -EMITTER VOLTAGE
Figure 17. Typical gate charge
(I C =15 A)
Figure 18. Typical capacitance as a function
of collector-emitter voltage (V GE =0V, f = 1 MHz)
t S C , S H O R T C I R C U I T W I T H S T A N D T I M E
10V
11V
12V
13V
14V
0μs 5μs
10μs 15μs
I C (s c ), s h o r t c i r c u i t C O L L E C T O R C U R R E N T
10V 12V 14V 16V
18V
0A
50A
100A
150A
200A
250A
V GE , GATE -EMITETR VOLTAGE
V GE , GATE -EMITETR VOLTAGE
Figure 19. Short circuit withstand time as a
function of gate-emitter voltage (V CE =600V , start at T J =25°C )
Figure 20.Typical short circuit collector
current as a function of gate-emitter voltage
(V CE ≤ 400V, T j ≤ 150°C)
SGB15N60HS
^
dimensions symbol
[mm] [inch]
min max min max A 9.80 10.20 0.3858 0.4016 B 0.70 1.30 0.0276 0.0512 C 1.00 1.60 0.0394 0.0630 D 1.03 1.07 0.0406 0.0421 E 2.54 typ. 0.1 typ. F 0.65 0.85 0.0256 0.0335 G
5.08 typ.
0.2 typ.
H 4.30 4.50 0.1693 0.1772 K 1.17 1.37 0.0461 0.0539 L 9.05 9.45 0.3563 0.3720 M 2.30 2.50 0.0906 0.0984 N
15 typ.
0.5906 typ.
P 0.00 0.20 0.0000 0.0079 Q 4.20 5.20 0.1654 0.2047 R
8° max
8° max
S 2.40 3.00 0.0945 0.1181
T 0.40 0.60 0.0157 0.0236 U 10.80 0.4252 V 1.15 0.0453 W 6.23 0.2453 X 4.60 0.1811 Y 9.40 0.3701 TO-263AB (D 2Pak)
Z 16.15
0.6358
P-TO263-3-2
Leakage inductance L σ =60nH and Stray capacity C σ =40pF.
Published by
Infineon Technologies AG,
Bereich Kommunikation
St.-Martin-Strasse 53,
D-81541 München
? Infineon Technologies AG 2002
All Rights Reserved.
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