电子信息工程本科毕业中英文翻译

英语原文：

Life of LED-Based White Light Sources

The interest for using light-emitting diodes (LEDs) for display and illumination applications has been growing steadily over the past few years. The potential for long life and reduced energy use are two key attributes of this rapidly evolving technology that have generated so much interest for its use in the above mentioned applications. Traditionally, the lamp life of light sources commonly used in illumination applications is determined by subjecting them to a predetermined on/off cycle until half the number of light sources cease to produce light. Unlike these sources, LEDs rarely fail catastrophically; instead, their light output slowly degrades over time. Even if an LED is technically operating and producing light, at some point the amount of light produced by the LED will be insufficient for the intended application. Therefore, the life of an LED should be based on the amount of time that the device can produce sufficient light for the intended application,rather than complete failure. Based on this argument, a recent publication from an industry group defines the life of an LED device or system for use in general lighting applications as the operating time, in hours, for the light output to reach 70% of its initial value.

The most widely used white LEDs incorporate a layer of phosphor over a GaN-based, short-wavelength light emitter. Usually, the phosphor is embedded inside an epoxy resin that surrounds the LED die. Some portion of the short-wavelength radiation emitted by the LED is down-converted by the phosphor, and the combined radiation creates white light.Early white LEDs were packaged similar to the indicator-style colored LEDs, specifically 5 mm and SMD (surface mount devices). Although these products demonstrated the concept of a white light source, they did not produce sufficient light for display and illumination applications. Furthermore, these indicator-style white LEDs had a relatively short life, 5000–10 000h to reach 70% light level under normal operating conditions. To address the higher luminous flux requirements, manufacturers have started to commercialize high-power illuminator LEDs that are presently producing over one hundred times the flux compared to indicator-style white LEDs. The higher light output is

achieved by using larger dies, higher drive currents,and improved heat extraction methods. In addition,some manufacturers are using better encapsulants to improve the life of white LEDs.

There are several studies that have investigated the aging mechanisms of GaN-based LEDs. During the 1990s,Barton et al. investigated the degradation of GaN-based blue LEDs and showed that light output reduction over time occurred primarily due to the yellowing of the epoxy surrounding the die. In 2001, Narendran et al. observed that indicator-style white LED packages degraded very rapidly, with the LEDs reaching the 50% light output level within 6000 h. In that same study, it was shown that the chromaticity values of the white LEDs shifted toward yellow over time, and it was speculated that the yellowing of the epoxy was the main cause for light output degradation. Therefore, based on past studies,the primary reason for the degradation of indicator-style white LED packages is the yellowing of the epoxy that is caused by excessive heat at the p-n-junction of the LED. Some of the newer illuminator-style white LEDs use encapsulant materials that have lower photodegradation characteristics,and therefore have a lower degradation rate. However, there are factors such as the degradation of the die attaché epoxy, discoloration of the metal reflectors and the lead wires, and degradation of the semiconducting element that are influenced by heat, and these all contribute to the overall degradation of the white LED. Although the newer high-power white LEDs would have a lower degradation rate compared to the early indicator-style devices, it is the heat at the p-n-junction that most influences the degradation. The heat at the p-n-junction is caused by the ambient temperature and the ohmic heating at the bandgap.

As stated earlier, long life is one key feature of LED technology that has attracted so many end-use communities. To benefit from the long-life feature, it is the final system that has to operate for a long time, not just the individual LED. As noted in past studies, heat at the p-n-junction is one of the key factors that determine the life of the white LED. Therefore, if systems are not properly designed with good thermal managemen techniques, even if they use long-life white LEDs the life of the final system would be short. Developing the relationship between junction temperature and life would be very useful

for producing long-life systems.

Although there are different methods available for estimating the junction temperature of LEDs, they are not very convenient,especially once the LEDs are integrated into a system . Furthermore, these methods are not direct; consequently, they are prone to erroneous results. Alternatively, it is much more convenient and direct to measure the heat at a location external to the LED package that is sufficiently close to the junction and where a temperature sensor can be directly attached. The temperature of this point should have a good relationship to the junction temperature. The point where a temperature sensor can be attached for this measurement could be the lead wire (cathode side) for the indicator-style LEDs and the board for high-power LEDs. Most manufacturers can recommend such a point,and we refer to this as the T-point in this manuscript.

Since white LEDs in the marketplace are packaged differently, their ability to transfer heat from the die to the surrounding environment is different from product to product. Therefore, it is reasonable to assume that different products have different degradation rates as a function of heat. A graph that shows the life of the LED as a function of T-point temperature is extremely useful for system manufacturers to build reliable, long-lasting systems. By knowing how much impact heat has on the degradation rate or life of the LED, the system manufacturer can select components and drive parameters, including the amount of heat sink and drive current, for a product being designed for a given application.

Therefore, the objective of the study presented in this manuscript was to investigate the relationship between the T-point temperature and life of a white LED. A second objective was to understand the degradation rate of different high-power white LED products presently available in the marketplace.

To understand the relationship between the T-point temperature and life, one type of high-power white LED that is commonly available in the marketplace was selected. Several of these LEDs were subjected to a life test under different ambient temperatures. The details of the experimental setup are described in the following paragraphs.

Because the different LED arrays have to operate at a particular ambient temperature, the arrays were placed inside specially designed, individual life-test chambers. The test chambers had two different functions: 1) to keep the ambient temperature constant for the LED arrays and 2) to act as light-integrating boxes for measuring light output. Each individual LED array was mounted at the center of the inside top surface of a life-test chamber. A photodiode attached to the center of the left panel continuously measured the light output.A small white baffle placed over the photodiode shielded it from the direct light, allowing only the reflected light to reach the photodiode. A resistance temperature detector placed on top of the baffle measured the chamber’s ambient temperature and controlled the heater that provided the necessary heat to the chamber through a temperature controller. The temperature in-side the box remained within ±1℃.The heater was attached to a raised aluminum plate with a matte-white cover that sat on the chamber floor. The temperature was estimated using a J-type thin wire thermocouple soldered to the T-point of white LED. For each chamber, an external LED driver controlled the current flow through the LEDs. All life-test were placed inside a temperature-controlled room. The life-test chambers were staggered vertically and horizontally to ensure that heat rising from the bottom chambers did not affect the chambers above them.

The results of this study underscore the importance of packaging white LEDs using proper thermal management to maintain light output, and thereby extend system life. Heat at the p-n-junction is one of the main factors that affect the life of white LEDs. Therefore, knowing the relationship between life and heat would be very useful for manufacturers who are interested in developing reliable, long-lasting systems.Results from the first experiment—conducted under various ambient temperatures to understand the relationship between T-point temperature and life—indicate that life decreases with increasing temperature in an exponential manner. Results from the second experiment—conducted to understand how different commercial white LEDs perform under identical operating conditions—show a large variation in life among the different packages, indicating that the packages used different heat extraction techniques and materials.

As part of ongoing research, we hope to further investigate how the different commercial LEDs are affected by heat and finally develop a family of curves that illustrate the relationship between life and T-point temperature for the different products.

中文翻译：

基于LED的白色光源的寿命

在过去几年中利用发光二极管(led)显示和作为照明应用的技术一直在稳步增长。较长的使用寿命和节能这两个关键属性使这一快速进化的技术已经对上述应用产生了如此巨大的利益。传统上，在照明应用中常用的光源灯泡寿命取决于他们到预定开/关循环直至一半光源停止产生光。和这些光源不同，LED很少如此轻易损坏；相反，它们的光输出随着时间的推移慢慢降低。即便LED在操作和产生光的技术上有了很大进步,但在某种程度上LED所产生的光量并不能满足特定应用的需求。因此,一个LED的寿命长短应该是基于该设备可以为所需要求产生足够的光的时间的长短,而不是彻底的损坏。基于这个观点,最近出版行业组织的定义规定适用于通用照明应用中的LED设备或系统的寿命是直到工作几个小时后能达到初始值的70%的光输出。

最广泛使用的白色LED是将一层荧光粉和GaN基封装在一起的短波光线发射器。通常把混有荧光粉的环氧树脂覆盖在GaN基模具上。LED基片发出的蓝光部分被荧光粉吸收，另一部分蓝光与荧光粉发出的黄光混合，可以得到得白光。早期的白色LED封装类似于彩色led指示灯,特别是5毫米和SMD(表面贴装设备)。虽然这些产品展示了白色光源的概念,但它们没有发出足够的光来显示和应用于照明程序。此外,这些指示灯式的白色LED寿命相对短暂,只能用5000-10000小时，正常工作时光线输出就只剩初始值的70%了。为了解决更高的光通需求,制造商已经开始商业化生产大功率led照明灯了。目前已经能批量生产超过指标式白色LED一百倍光通以上的白光LED 了。更高的光输出是通过使用更大的模具,更高的驱动电流,改善热提取方法提取方法实现的。此外,一些制造商为了改善白光LED的寿命使用了更好的密封材料。

有多项对GaN基LED老化机制的研究。在20世纪90年代,巴顿等人研究的GaN基蓝色LED降解实验表明光输出随时间减少的主要原因可能是由于周围的环氧模具泛黄。2001年,Narendran等人

发现指标式白光LED封装降解非常迅速,LED光输出水平在6000小时内就只剩下初始值的50%,而且在同一研究中显示白色发光二极管的色度值转向泛黄,有人推测可能是黄色的环氧树脂为光输出退化的主要原因。因此,根据过去的研究,指标式白光LED封装退化的主要原因是环氧树脂变黄，造成过多的热量在LED的PN结。一些较新的照明式白色LED使用的封装材料有较低的光降解特征,因此有较低的降解率。然而,有很多因素如退化的环氧树脂模具、变色的金属反射镜和导线,和退化的半导体元素等都影响了LED的散热。这些都将促使白光LED的整体退化。尽管新的大功率白色LED比早期的指示灯式设备降解率更低,但它的PN结高温最能影响降解。PN结过热在带隙引起的环境温度变化和电阻变化。

如前所述，寿命长的LED技术是一个关键特性，已经吸引了这么多的最终用途社区。受益于长寿命的特点，最终的系统有一段很长的运作时间。在过去的研究指出，在pn结的热量是确定的白光LED的寿命的关键因素之一。因此，如果系统不妥善设计具有良好的散热技术，即使他们使用长寿命的白光LED，最终系统的寿命仍将是短期的。研究基点的交界处的温度和寿命的关系，将对生产长寿命的系统非常有用。

虽然有不同的方法估算LED的结温，他们是不是很方便，尤其是当发光二极管集成到一个系统。此外，这些方法不是直接的，因此，他们容易产生错误的结果。更方便的直接测量热量的方法是利用一个足够接近路口的温度传感器，这个传感器可以直接连接到LED封装外部位置。这一点的温度应该有一个良好的合作关系结温。利用温度传感器可以测量这个连接点。这个连接点可能是引线（阴极侧）为指标式的LED和高功率LED板。多数厂家可以引进我们所说的这个论文中所指的T点。

由于白光LED在市场上是不同的包装，从产品到产品的能力，从模具转移到周围环境中的热量是不同的。因此，不同的产品有不同的降解率作为热源的功能这个假设是合理的。这里有一个显示作T点温度和LED的使用寿命关系的图表，对建立可靠长期的系统的系统制造商非常有用。知道多大影响热降解率或LED的寿命，系统制造商可以选择的组件和驱动器参数，包括散热器和驱动电流的量，为特定应用而设计产品。

因此，在这个论文的研究目的是调查的T点的温度和白光LED的寿命之间的关系。第二个目标是要了解不同的高功率白光LED产品目前在市场上提供的降解率。

为了了解T点的温度和寿命之间的关系，选用了一个在市场上普遍能买到的高功率白光LED 类型。在不同的环境温度下对这些LED寿命进行试验。在以下各段的实验装置中进行详细描述。

因为不同的LED阵列必须运行在一个特定的环境温度下，阵列被放在专门设计的单独的寿命试验箱里，试验箱有两种不同的功能：保持LED阵列所处的环境温度稳定和作为光测量光输出的集成箱。每个单独的LED阵列被安装在寿命试验箱中心的内顶面。在左侧面板的中心连接一个二极管用于连续测量光输出。在光电二极管周围放置一个小的白色挡板用于屏蔽直射光，使光电二极管只能接收到反射光。在挡板上放置一个电阻温度探测器用来衡量试验箱的环境温度和控制加热器来提供必需的热量，在侧框室通过温度控制器使温度保持在±1℃。加热器伸出的铝板与白色隔板连接着。使用J-焊接型细线热电偶来估计白光LED的T点温度。外部LED驱动器控制通过每个分庭的LED电流。所有的寿命测试都放置一个温度控制的房间内。寿命试验箱交错垂直和水平放置以确保热量从底部隔板上涨时不会影响他们之上的隔板。

这项研究的结果强调白光LED包装的重要性，使用适当的热管理以保持光输出，从而延长系统的使用寿命。在pn结的热量是影响白光LED的使用寿命的主要因素之一，因此，第一次实验在各种环境温度下对T点温度和寿命之间的关系进行了研究，通过实验表明对于对发展可靠长期系统感兴趣的厂家，了解寿命和热之间的关系将是非常有用的。第二次试验是寿命随温度指数的跌幅。了解在不同的包装不同的热提取技术和材料的商业白光LED在执行相同作业条件下寿命的差别。

作为正在进行的研究的一部分，我们希望进一步探讨不同的商业LED受热的影响，并最终建立一个体系，说明不同产品之间的生活和T型点温度的关系曲线。

各专业的英文翻译

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电子信息工程专业课程翻译中英文对照表

电子信息工程专业课程名称中英文翻译对照 （2009级培养计划）

实践环节翻译

高等数学Advanced Mathematics 大学物理College Physics 线性代数Linear Algebra 复变函数与积分变换Functions of Complex Variable and Integral Transforms 概率论与随机过程Probability and Random Process 物理实验Experiments of College Physics 数理方程Equations of Mathematical Physics 电子信息工程概论Introduction to Electronic and Information Engineering 计算机应用基础Fundamentals of Computer Application 电路原理Principles of Circuit 模拟电子技术基础Fundamentals of Analog Electronics 数字电子技术基础Fundamentals of Digital Electronics C语言程序设计The C Programming Language 信息论基础Fundamentals of Information Theory 信号与线性系统Signals and Linear Systems 微机原理与接口技术Microcomputer Principles and Interface Technology 马克思主义基本原理Fundamentals of Marxism 毛泽东思想、邓小平理论 和“三个代表”重要思想 概论 Thoughts of Mao and Deng 中国近现代史纲要Modern Chinese History 思想道德修养与法律基 础 Moral Education & Law Basis 形势与政策Situation and Policy 英语College English 体育Physical Education 当代世界经济与政治Modern Global Economy and Politics 卫生健康教育Health Education 心理健康知识讲座Psychological Health Knowledge Lecture 公共艺术课程Public Arts 文献检索Literature Retrieval 军事理论Military Theory 普通话语音常识及训练Mandarin Knowledge and Training 大学生职业生涯策划 （就业指导） Career Planning (Guidance of Employment ) 专题学术讲座Optional Course Lecture 科技文献写作Sci-tech Document Writing 高频电子线路High-Frequency Electronic Circuits 通信原理Communications Theory 数字信号处理Digital Signal Processing 计算机网络Computer Networks 电磁场与微波技术Electromagnetic Field and Microwave

电子信息类专业英语翻译

1.This electron beam sweeps across each line at a uniform rate，then flies back to scan another line directly below the previous one and so on，until the horizontal lines into which it is desired to break or split the picture have been scanned in the desired sequence． 电子束以均匀的速率扫描每一行，然后飞速返回去扫描下一行，直到把被扫描的图像按所希望的顺序分割成行。 2.The technical possibilities could well exist，therefore，of nation-wide integrated transmission network of high capacity，controlled by computers，interconnected globally by satellite and submarine cable，providing speedy and reliable communications throughout the word 因此，在技术上完全可能实现全国性的集成发送网络。这种网络容量大，由计算机控制，并能通过卫星和海底电缆实现全球互联，提供世界范围的高速、可靠的通信。 3.Transit time is the primary factor which limits the ability of a transistor to operate at high frequency． 渡越时间是限制晶体管高频工作能力的主要因素 4.The intensity of sound is inversely proportional to the square of the distance measured from the source of the sound. 声强与到声源的距离的平方成反比。 5.The attenuation of the filter is nearly constant to within 0.5 dB over the entire frequency band． 该滤波器的衰减近于恒定, 整个频带内的变化在0.5 dB以内。 6.At present, the state of most semiconductor device technology is such that the device design and process technology must be supplemented by screening and inspection procedures, if ultimate device reliability is to be obtained and controlled． 目前, 大多数半导体器件的技术尚未十分完善, 以至若要获得并控制器件最终的可靠性, 就必须辅以筛选和检验, 以弥补设计和工艺技术之不足 7.Bandwidth of transistor amplifiers vary from about 250 MHz in the L band to 1000 MHz in the X band． 晶体管放大器的带宽在L波段约为250 MHz, 在X波段为1000 MHz。 8.The output of the differential amplifier is fed to the circuit’s output stage via an offset-compensation network, which causes the op-amp’s output to center at zero volts. The output stage takes the form of a complementary emitter follower, and provides a low-impedance output. 差动放大级的输出通过一个失调补偿网络与输出级相连, 目的是使运放的输出以0 V为中心。输出级采用互补的射极跟随器的形式以使输出阻抗很低 9.Because of the very high open-loop voltage gain of the op-amp, the output is driven into positive saturation (close to +V) when the sample voltage goes slightly above the reference voltage, and driven into negative saturation (close to-V) when the sample voltage goes slightly below the reference voltage. 由于运放的开环电压增益很高, 当取样电压略高于参考电压时, 输出趋向于正向饱和状态(接近+V)。当取样电压低于参考电压时, 输出趋向于负向饱和状态(接近-V)。 10.If the signal source were direct connected instead of capacitor coupled, there would be a low resistance path from the base to the negative supply line, and this would affect the circuit bias conditions. 如果信号源和电路不是用电容耦合而是直接相连，从基极到负电源线就会一个低阻通路，并且这将影响到电路偏置状态 11.The differential amplifier has a high-impedance (constant-current)“tail”to give it a high input impedance and a high degree of common-mode signal rejection. It also has a high-impedance collector (or drain) load, to give it a large amount of signal-voltage gain (typically about 100 dB). 差动放大极有一个高阻抗的“尾巴”（恒流源）以提供高输入阻抗和对共模信号的深度抑制，同时，它还具有一个高阻抗和集电极或漏极负载以提供高的信号电压增益（典型的数据是100dB). 12.On the other hand, a DC negative-logic system, as in Figure 3.6(b), is one which designates the more negative voltage state of the bit as the 1 level and the more positive as the 0 level. 另一方面, 如图3.6(b)所示, 把比特的较低的电压状态记为1电平, 较高的电压状态记为0电平, 这样的系统称为直流负逻辑系统。 13.For example, to represent the 10 numerals (0, 1, 2, …, 9) and the 26 letters of the English alphabet would require 36

管理信息系统中英文翻译资料

Managemengt Information Systems By a management information system,we propose the follow alternate definition: an integrated uer/machine system (usually computerized) for providing information to support decision making in an enterprise. The key elements of this definition are —An integrated uer/machine system —For proving information —To support decision making —In an enterprise A management information system utilizes —Computer hardware and software —Manual procedures —Models for analysis —A database Just as there is a logical flow of materials in the creation of a product, there is logical flow of information in a management information system.In manufacturing,raw materials move through a process that transforms the raw materials into usable products. In a similar fashion, in an information system,data are supplied to a system(input), the data are manipulated(processed),and they are transformed into information(output).In its simplest form ,a management information systemed may be depicted by an input-process-output(IPO) model

电子信息工程专业英语作业3

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